Company Website: http://www.teradyne.com
NORTH READING, Mass. -- (Business Wire)

Approximately 300 Teradyne (NYSE:TER) users attended the 29th annual Teradyne Users Group (TUG) conference held at the Hilton Head Marriott in Hilton Head, SC on April 30-May 2. TUG is the test industry's longest running user group conference attracting licensed users of Teradyne products from all over the world.

Attendees enjoyed three days of technical papers as well as the opportunity to connect with fellow Teradyne users. Dr. Rajendra Singh of Clemson University kicked off the conference with his Keynote address, “Innovative Paths for Sustained Economic Growth of Semiconductor Industry with Lower Profitability." Nine vendors shared their products and solutions with the attendees. The TUG 2012 papers and presentations are now available for TUG attendees via eKnowledge and will be available for all eKnowledge users on June 1.

“The real improvements in your work often come not from the big ideas, but from the little hints and observations,” said Tom Munns, Semiconductor Test consultant, Texas A&M University and TUG 2012 chairman. “TUG provides a venue to keep you connected with your peers and pick up those little tidbits of knowledge that can help you in your job. We had a great conference in Hilton Head and look forward to seeing everyone in Fort Worth, Texas in 2013."

The TUG Steering Committee is pleased to announce the winners of the Best Paper Awards. The winners listed below were selected by peer evaluation on overall presentation and content.

Defense and Aerospace Track: "TDR Tests of Serial Bus Components Using the Di-050" presented by James Blake and Kevin Hickey, Draper Labs.

Digital Track: "SB6G Captures High Speed Serial ADC Data to JESD204 Standard" presented by David Brown, Analog Devices and Peter Higgins, Teradyne.

Memory Track: "Magnum2 Codeless Programming" presented by Raoul Belleau, Teradyne.

Mixed Signal Track: "Using Cross-Correlation to Improve Accuracy of Noise Measurements" presented by Colin Chow, Teradyne.

Power Management/Automotive Track: "Rise/Fall Time Measurements with QTMU…How Low Can You Go?" presented by Chuck Carline, Teradyne.

RF Wireless Track: "Protocol Aware: Simplifying Test Development for Complex RF SOC Devices" presented by Ron Burke and Steve Munroe, Teradyne.

Test Infrastructure and Production Session Track: "Providing 5x DIB Application Space on FLEX and UltraFLEX" presented by Kevin Manning, Teradyne.

TUG 2013 will take place April 29 - May 1 at the Renaissance Worthington in Fort Worth, TX. Stay up to date on the latest TUG happenings at www.teradyne.com/tug. You can also follow TUG on Facebook, www.facebook.com/TeradyneUsersGroup and Twitter, www.twitter.com/TUGconference.

About Teradyne

Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test semiconductors, wireless products, data storage and complex electronic systems which serve consumer, communications, industrial and government customers. In 2011, Teradyne had sales of $1.4 billion and employs approximately 3,300 people worldwide. For more information, visit www.teradyne.com. Teradyne(R) is a registered trademark of Teradyne, Inc. in the U.S. and other countries.

Editor’s Note: For product photography and other resources, please visit Teradyne’s press room at: http://www.teradyne.com/pressRoom/index.html.

Contacts:

Teradyne, Inc.
Jessica Faulkner, 978-370-1437
Public Relations
jessica.faulkner@teradyne.com

Source: Teradyne, Inc.